FT-331 four probeBlock resistance tester

One Description:

The use of van der Waals measurement principle can solve the influence and error of external factors such as geometric dimensions, boundary effects, probe misalignment, and mechanical drift on the measurement results of samples. It provides communication interfaces, PC software data processing, and data analysis Chinese or English language version

II Reference standard:

The standard for measuring the resistivity of silicon wafers (ASTM F84) and national standard design and manufacturing; GB/T 1551-2009 "Method for determination of resistivity of silicon single crystals" and GB/T 1552-1995 "DC four probe method for determination of resistivity of silicon and germanium single crystals"

III Scope of application:

Suitable for production enterprises, universities, and research departments, it is a tool for inspecting and analyzing the quality of semiconductor materials; LCD display, automatic measurement and coefficient compensation, with temperature compensation function, automatic range conversion; Adopting AD chip control, constant current output, optional: PC software, saving and printing data, generating reports

Used for: covering film; Conductive polymer film, high and low temperature electric heating film; Thermal insulation, conductive window film, conductive (shielding) cloth, decorative film, decorative paper; Metallized labels, alloy foil films; Melting, sintering, sputtering, coating, coating layers, resistive and capacitive touch screen films; Electrode coatings, other semiconductor materials, thin film materials, and related products for square resistance testing

4 Model and parameters of block resistance tester